Microscopy Solutions Blog

sub-nm 3D metrology inside an EBL tool with atomic force microscopy

Characterization of EBL exposed PMMA resist using a compact sample holder-mounted AFM...

Electron Channelling Contrast Imaging - An Effective Technique in Scanning Electron Microscopy

In this application note, Zeiss demonstrates the use of the ZEISS GeminiSEM 500 for electron channelling contrast imaging (ECCI).

Combined Resolution and Calibration Standards for Nanoscale Imaging

Ted Pella presents the AuSome™ combined resolution and calibration standards for nanoscale imaging. These consist of known and uniform gold particles on a silicon chip.

Advanced Nanomeasurement Solutions for Research, Industry and Education

Keysight Technologies' range of instrumentation offers a variety of flexible scientific-grade solutions to meet unique nanomeasurement requirements. Further details are highlighted in this comprehensive brochure.

...

X-ray Microscope Offering Microtomography of Large Samples at High Resolution

Rigaku's nano3DX is a true X-ray microscope (XRM) with the ability to deliver 3D computed tomography (CT) images of relatively large samples at high resolution. This is accomplished by using a high powered rotating anode X-ray source and a...

Compact Scanning Electron Microscope with Unparalleled Imaging

Hitachi has introduced a scanning electron microscope – the FlexSEM 1000 – designed to change your view of electron microscopy.

Understanding the Basics of the Scanning Electron Microscope

Since the scanning electron microscope (SEM) was first commercialized about 40 years ago the SEM has shown remarkable progress. Now many types of SEMs are being used and their performance and functions differ greatly from each other. To utilize...

Streamlining Microscopy Sample Prep using mPrep System

Electron Microscopy Sciences introduces its mPrepTM System for specimen preparation and grid staining. Using the system enables consistent sample preparation with almost no direct handling of specimens and grids. 

Improving Imaging Data Analysis using “MCR Model Analysis”

Jasco has produced an application note that provides an example of imaging data analysis using “MCR Model Analysis” in the Micro Imaging Analysis program for the IRT-5000/7000 series FT/IR microscopes. MCR Model Analysis is a function which...

Subscribe to FREE learning from the experts!