Are you looking for a method to simplify and accelerate analysis of volatile hazardous substances in diverse working environments? If so, this presentation may be what you need...
Many volatile organic compounds (VOCs) and inorganic gases pose a significant risk to human health in workplaces ranging from manufacturing to logistics to offices. Traditional analytical techniques for determining exposure are either impractical for onsite monitoring or are portable but have low selectivity. This presentation introduces selected ion flow tube mass spectrometry (SIFT-MS) – an innovative and industry-proven analytical technique that directly, instantly and comprehensively analyzes air to part-per-trillion (ppt) concentrations (by volume).
The presenters, Vaughan Langford and William Kerr, will introduce various workplace and indoor air quality applications of SIFT-MS, including analysis of fumigation chemicals in shipping containers, multiple-point indoor air quality monitoring, and high-throughput laboratory applications. They will describe fundamentals of the SIFT-MS analytical technique and how SIFT-MS delivers immediate analytical results for chemically diverse toxic inorganic gases and VOCs, benefiting a wide range of indoor air quality and workplace safety applications. In addition, they will explain how SIFT-MS compares with traditional methods for volatiles analysis, including GC-MS and HPLC.
The talk will go on to discuss how SIFT-MS revolutionizes sample throughput in routine testing laboratories, is utilized in front-line operations for lab-quality sample analysis by non-technical operators, and can be applied to continuous multi-point monitoring of hazardous substances.