Rapid Volatile Impurity Analysis in Pharmaceutical Products Using Direct MS

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Presenters
MarkPerkins_Work.pngMark Perkins (Anatune, UK)


VaughanLangford_Hub.pngVaughan Langford
(Syft Technologies, New Zealand)

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Volatile compounds occur frequently as impurities in pharmaceutical products and are often of concern because of their toxicity. SIFT-MS is a new tool for real-time, selective, and economical trace gas and headspace analysis of volatile compounds, including chromatographically challenging ones such as formaldehyde, formic acid, and ammonia.

Direct, broad-spectrum analysis using SIFT-MS provides new opportunities across multiple pharmaceutical applications, including:

  • simple formaldehyde analysis
  • residual solvent analysis
  • packaging screening, including residual monomer analysis

View this on-demand webinar to learn more about how SIFT-MS works and how it speeds and simplifies common pharma VOC analysis applications.

By viewing this on-demand presentation you will...

  • learn the fundamentals of the selected ion flow tube mass spectrometry (SIFT-MS) technique, including its ability to selectively and comprehensively analyse samples in one, simple procedure
  • discover how SIFT-MS can greatly increase sample throughput for residual monomer and residual solvent analysis
  • understand — from a formaldehyde case study— how SIFT-MS can eliminate sample preparation through direct analysis
SIFT-MS revolutionises headspace and gas analysis through application of direct, ultra-soft chemical ionisation. Attend this webinar to learn how direct analysis using SIFT-MS can resolve longstanding throughput challenges for diverse pharmaceutical applications.

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