Semivolatiles are typically analysed using splitless injection, but this approach results in slow analysis times, frequent maintenance due to matrix accumulation, and injection-to-injection variability. Combined, these factors reduce the number of samples that can be analysed before quality control criteria are no longer met. Using split injection is a simple way to increase sample throughput for semivolatiles analysis because it provides faster oven cycle times due to the use of higher initial oven temperatures. In addition, because less matrix is injected onto the column, more samples can be analysed before downtime is required for maintenance.
As an alternative to splitless injection, using split injection with a robust, low-bleed Rxi-5Sil MS column produces highly repeatable results for trace-level analysis of semivolatiles, such as those listed in EPA Method 8270D.
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